CM

Introducing a completely new design of the Contaminometer (CM+ series process ionic contamination testers).
This new design is linked to the introduction of the new process control metric introduced by Gen3 Systems: Process Ionic Contamination Testing. The CM+ series measures the amount of ionic contamination in accordance with all existing test methods, often referred to as ROSE testing, as well as the new PICT test.

Soren Tranberg

Sales consultant
+45 20198020
st@hin.dk

Søren Tranberg has worked with sales of SMT solutions to the Nordic electronics industry for 25 years. Through his many years of work with SMT, including MES and NPI software solutions as well as AOI/SPI/X-ray, Søren has acquired extensive knowledge of SMD production in practice, and he is happy to share this knowledge with customers.